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Short professional profile and skills:
Giuseppe Francesco Indelli was born in Catania (Italy) in 1969.
He takes High Technical Diploma of “Perito Industriale Capotecnico” in Industrial Electronics at the I.T.I.S. Archimede of Catania in 1987, with final mark 53 out of 60.
He takes qualification to practise profession as "Perito Industriale" specialized in Industrial Electronics in 2010, with final mark 91 out of 100.
1989 – 1991. Fellowship of the National Research Council (CNR). Fellow position as Electronic Technician at the “Istituto per la Chimica e la Tecnologia dei Materiali Polimerici (ICTMP)” which was mainly focused on Electronic, Software and Ultra High Vacuum troubleshooting and fault finding related to the system maintenance of Magnetic-Sector Mass Spectrometry KRATOS MS 50S.
In 1992 he obtained a Fellowship of the Consorzio Catania Ricerche with position of Electronic Technician.
From 1993 to present he is Senior Technical Support on Analytical Instruments of the Laboratory of Surfaces and Interfaces (Consorzio Catania Ricerche).
Webmaster and Senior IT Support of Consorzio Catania Ricerche.
Co-author of scientific papers and poster presentations. Here is my list of publications.
Experience and Knowledge
Senior Technical Support to the research activity in Material Science at Laboratory of Surfaces and Interfaces (Superlab).
Twenty year's experience in Ultra High Vacuum Scientific Equipments of major world-wide manufactures, within Academic Organisations and Research Laboratories.
Deep experience in installation, maintenance and testing of Ultra High Vacuum Analytical Instruments of major world-wide manufactures, like XPS, SIMS spectrometer and analytical instruments for Surface and Material Science.
Experience on scientific instrumentations with real-time control, data acquisition and processing applications.
Experience and deep skill in maintenance and fault finding of electronics units for surface analysis systems. This covers a broad range of high performance analogue and digital electronic cards.
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